International Biometrics Conference to Meet at NIST March 2-4

The National Institute of
Standards and Technology (NIST) is co-sponsoring an international
conference on biometric performance March 2-4 at NIST headquarters in
Gaithersburg, Md. Related workshops will be held March 1 and March 5.

The “International Biometric Performance Conference
(IBPC): Performance, Evaluation and Specification of Biometric
Technologies” will bring together biometric users, technology providers,
integrators and evaluators. The conference aims to identify how the
accumulated experience of the past decade (research, evaluation,
deployment, outcomes) can be leveraged to direct future biometrics-based
research and applications. The conference will address the required
properties of core algorithms used to determine if two sets of biometric
data, such as fingerprints or voice prints, belong to the same
individual. Another goal is to identify novel evaluation methodologies
and recent trends in testing and determine what performance criteria are
most relevant in the context of the contemporary and emerging
marketplaces.

Three separate workshops will be held in conjunction
with the conference. They will address fingerprint image quality,
biometric template protection testing, and fingerprint feature
conformance.

The IBPC 2010 conference is co-sponsored by NIST, the
National Physical Laboratory (UK) and Fraunhofer Institute for Computer
Graphics Research (Germany). Registration deadline is Feb. 24.

For more information on the conference, see the conference
program at http://biometrics.nist.gov/ibpc2010/program.pdf.
To register, go to https://www.fbcconferences.com/nist_biometrics/atreg1.aspx.
Press interested in attending should contact Evelyn Brown at evelyn.brown@nist.gov.

Media contact: Evelyn Brown, evelyn.brown@nist.gov, (301)
975-5661.